As IC geometries shrink, the large, consolidated memory blocks within ICs are giving way to tens or even hundreds of smaller memory arrays distributed throughout each chip. These arrays serve as ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

How often have you struggled to verify static random-access memory (SRAM) blocks in your design? And how often, no matter how much time you spend on them, do they end up causing manufacturing issues?

* MG3700A High-speed Arbitrary Waveform Baseband Generator, 120 MHz Bandwidth, and 6 GHz Frequency Range Important for 3.5G Technologies Such As HSDPA * Richardson, Texas—Anritsu Company introduces ...