Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

In this paper, the author proposes a Test Pattern Generator (TPG) for built-in self-test. This method generates Multiple Single Input Change (MSIC) vector, which in turn are applied to the scan chain.

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

In this paper, low power Built-In-Self-Test (BIST) is implemented for 32 bit Vedic multiplier. This paper is to reduce power dissipation in BIST with increased fault coverage. Various methods of ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with ...