Ripples arise while characterizing devices at RF and microwave frequencies. RF engineers need to make sure that measurement set-up is properly calibrated and matched in order to avoid measurement ...
Morning Overview on MSN
LLMs have tons of parameters, but what is a parameter?
Large language models are routinely described in terms of their size, with figures like 7 billion or 70 billion parameters ...
Demands for mission critical wireless services such as autonomous driving and telehealth require higher data transfer rates and lower latencies. Such applications are now driving the use of radio ...
As high-speed serial data rates advance beyond 50 Gb/s, conventional logic-emulating non-return-to-zero (NRZ) signaling is being replaced by PAM4, a four-level pulse amplitude-modulation scheme. PAM4 ...
Modulation bandwidths continue to grow, promising higher data rates yet imposing test difficulties. Most test technologies are still rooted in past, narrowband architectures, which are increasingly ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
The low-frequency LCR meter is the instrument of choice for many component measurements. Although manufacturers have developed different measurement techniques, fundamentally the meter compares the ...
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