Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Widely available and nearly unlimited compute resources, coupled with the availability of sophisticated algorithms, are opening the door to adaptive testing. But the speed at which this testing ...
Expertise from Forbes Councils members, operated under license. Opinions expressed are those of the author. So, what does this mean for the organizations that develop these products? It means that ...
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