insights from industryJaspreet SinghApplication ScientistThermo Fisher Scientific In this interview, AZoM talks to Jaspreet Singh from Thermo Fisher Scientific, about how FTIR microscopy can be ...
The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...
These developments continue to fuel growing investment into the technology and manufacture of semiconductor devices at both industrial and academic research levels. Improvements in technology, ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
Failure analysis labs are becoming more fab-like, offering higher accuracy in locating failures and accelerating time-to-market of new devices. These labs historically have been used for ...
When a chip malfunctions it’s the job of the failure analysis engineer to determine how it failed or significantly deviated from its key performance metrics. The cost of failure in the field can be ...
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