Engineers could avoid expensive redesigns by planning medical device testing early in development with expert guidance.

Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Papers presented at the production test session at Semicon West surveyed the increasing problems that technology integration is causing for the test world. They concluded that chip designers who are ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

With the move to advanced process technologies, concerns over device power once largely limited to specialized markets have escalated rapidly among mainstream designers. More semiconductor companies ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

A higher form of simulation, digital twins collect data to create accurate simulations that display the operation, potential failures, and possible future maintenance issues in manufacturing equipment ...