This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...

Using high-speed atomic force microscopy (HS-AFM), the Kanazawa University team led by Mikihiro Shibata filmed the dynamic movements of CaMKII at the single-molecule level. The images revealed that a ...

An integrative modeling workflow to understand with atomistic precision biomolecular dynamics from high-speed atomic force microscopy experiments. (Nanowerk News) High-speed atomic force microscopy ...

The predicted orientation of the Cas9 protein on the AFM substrate is shown, and a simulated AFM image calculated in the scanning view perspective shows remarkable agreement with previous HS-AFM ...

(Nanowerk News) Take a photo with your phone and you might see wonderful details—leaves on a tree, strands of hair blowing in the wind. The width of that strand of hair is 100,000 nanometers wide. The ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Nano-Observer II is a state-of-the-art ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Researchers at the Ningbo Institute of Materials Technology and Engineering (NIMTE), part of the Chinese Academy of Sciences, ...